InGaAs Φ 200μm APD Chip


Response wavelngth 0.9~1.7μm, Responsivity 1.0A/W@1550nm, Active area size Φ200μm, Material InGaAs ( MOQ 50PCS )

Part Number  :  LP-APD200
Unit Price  :  USD [Please inquire]
Lead time  :  in stock
Inventory quantity   :   [Please inquire]
Stock NO.   :  I80030015
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InGaAs Avalanche Photodiode (APD) chips are semiconductor devices that are designed to detect weak optical signals in the infrared region. They are used in a variety of applications, such as fiber optic communications, LIDAR, and sensing. An APD is a type of photodiode that incorporates an internal gain mechanism, which allows it to achieve higher sensitivity than a standard photodiode. The gain is achieved through a process called avalanche multiplication, where a single photon creates an electron-hole pair, which then undergoes impact ionization, producing additional electron-hole pairs. This process results in an amplified output signal. InGaAs APDs are particularly useful for detecting wavelengths between 800 and 1700 nm.LD-PD INC is a company who design and manufacture InGaAs APD Chips.

Electro-Optical Characteristics (@ Tc=22±3℃)

Parameter

Symbol

Test   Condition

Min.

Typ.

Max.

Unit

Response Spectrum

λ

950 ~ 1700

nm

Responsivity

Re

λ=1550nm

Pin=1μW,  M=1

0.90

1.00

A/W

Multiplication factor

M

λ=1550nm

Pin=1μW, VR=VBR-3

10.00


λ=1550nm

Pin=1μW, VR=VBR-1

30.00

Dark Current

Id

VR=VBR-3, Pin=0μW

8.00

50.00

nA

-3dB Cut-off frequency

BW

M=10

RL=50Ω

0.60

1.25

GHz

Reverse Breakdown Voltage

VBR

I=10μA, Pin=0μW

35.00


50.00

V

Capacitance

C

VR=VBR-3, f=1MHz

1.80

2.00

pF

Temperature Coefficient of VBR

γ

IR=10μA,  Pin=0μW

-55~+85

0.07

0.11

0.15

V/℃


Absolute Maximum Rating

Parameter

Symbol

Min.

Max.

Unit

APD Voltage supply

VPD

VBR

V

Operating Temperature

TC

-40

+85

⁰C

Storage Temperature

TSTG

-55

+125

⁰C

Forward Current

IF

5

mA

Reverse Current

IR

3

mA


Typical Performance Curves  (@ Tc=22±3℃)

APD2.jpg


APD3.jpg


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