Technology

Dedicated to multi style packaging and diversified application fields

ACCURATE WAVELENGTH SCREENING

LD-PD can perform wavelength screening on COC chips, providing photon chips with a tolerance better than ± 1nm. LD-PD has a near-infrared high-speed acquisition wavelength meter, and a mid infrared FTIR Fourier spectrometer for strict screening of all wavelengths

AUTOMATIC POWER MONITORING

The fully automatic L-I-V curve detection system independently developed by LD-PD greatly improves the efficiency of semiconductor laser testing. It automatically measures the relationship between laser power and driving voltage with current changes, and draws relevant curves in real time

PRECISION SPECTRAL ANALYSIS

Anritsu MS9740B Spectral Analyzer covers 600-1750nm, 0.07nm resolution, dynamic range 70dB, AQ6375E mid infrared spectrometer 1000-2500nm resolution, 0.05nm dynamic range 50dB

CHARACTERIZATION OF BEAM QUALITY

Beam quality is an important aspect of laser beam characterization. LD-PD analyzes the 2D/3D profile of the laser beam, evaluates M2, and analyzes the beam quality of the laser

FREE ASSEMBLY DRIVE

Users can customize pins, compatible with any pin definition; Can be assembled after welding to improve product reliability; Ultra low noise circuit design meets the requirements of narrow linewidth and low noise in the sensing field

Accurate wavelength control accuracy

LD-PD can perform wavelength screening on our COC chips, providing customers with photon chips with a tolerance better than ± 1nm. We have a near-infrared high-speed acquisition wavelength meter, and a mid infrared FTIR infrared Fourier spectrometer that can perform limited screening and benchmarking of all wavelengths to meet customer wavelength requirements.

Near infrared high-speed acquisition wavelength me
Mid infrared FTIR infrared Fourier spectrometer
Limited screening of all wavelengths

AUTOMATIC POWER MONITORING

The LD-PD fully automatic L-I-V curve detection system
is our independently developed testing system.

This system greatly improves the efficiency of our semiconductor laser testing.
The system can automatically measure laser power

And the relationship between the driving voltage and the change of current,
and real-time plotting of relevant curves.

Full wavelength accurate spectral analysis

MS9740B Anritsu Spectral Analyzer
AQ6375E Yokogawa Mid infrared Spectrometer

  • MS9740B Anritsu spectral analyzer covers a wavelength range of 600-1750nm
  • MS9740B Anritsu has high resolution and wavelength accuracy The characteristics of being suitable for single-mode and multi-mode optical fibers, with high cost-effectiveness
  • AQ6375E not only covers telecommunications wavelengths, but also the SWIR area commonly used in environmental sensing and medical applications
  • There are three models of AQ6375E, Coverage: 1200 to 2400 nm [standard and limit level], 1000 to 2500 nm [extended level]
Anritsu 9740B Spectral analyzer
AQ6375E Yokogawa MIR Spectrometer
Anritsu Spectral analysis test data
AQ6375E Spectral Analysis Test Data

Characterization of beam quality

Analyze the 2D/3D profile of the laser beam.

M2 analysis and evaluation, analyzing the beam quality of the laser.

Beam quality analysis equipment
The ability of M2 testing to analyze and evaluate laser quality

Detachable Low Noise Driver Integration

  • Custom pin definitions are compatible with any pin definition
  • It can be assembled after welding to improve packaging reliability.
  • Ultra low noise circuit design, meeting the requirements of narrow linewidth and low noise in the sensing field.
Low noise circuit board
Can customize pin definitions arbitrarily
Low noise testing level
""LD-PD provides innovative photonics, optoecrctronics,and advanced electronic systems for aerospace&defense,medical,Biochemistry,and Quantum applications who need demand high reliability,high-performance and market-driven technology solutions today.