1310nm High power DFB laser diode Chips


Central wavelength 1310nm, Output power 50mW, SMSR 45dB, Linewidth width 3MHz(Min qty: 50pcs)

Part Number  :  DWD-DFBCHIPS-A-A81-W1310
Unit Price  :  USD [Please inquire]
Lead time  :  in stock
Inventory quantity   :   [Please inquire]
Stock NO.   :  I80011006
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The laser diode with a period grating provides a high side-mode suppression ratio (SMS) over a wide temperature range. In order to achieve the high bias injection efficiency and low leakage current,waveguide stripe is applied for current confinement. The waveguide stripes, including multiple quantum wells (MQWs) active layers and period grating for low threshold current, high slope efficiency and high temperature characteristic (TO) design.

The laser diode with alignment mask and broad-area metal pad on the p-side is designed for p-side down mounting process. The continue-wave DC characteristic over wide temperature range of laser chips have been verified and validated repeatedly.


Electrical/Optical Characteristics (Tsub=25°C, CW bias unless stated otherwise)

Parameter

Symbol

Min

Typ

Max

Unit

Centre Wavelength

λ

1306

1310

1316

nm

Side Mode Suppression Ratio

SMSR

35

45


dB

Threshold Current

Ith


20

40

mA

Operating Current

Iop


230

250

mA

Chip output Power

Pf

50

70


mW

Quantum Efficiency

η

0.2

0.3


mW/mA

Current Tuning Coefficient

∆λ/∆I


0.015


nm/mA

Temperature Tuning Coefficient

∆λ/∆T


0.12


nm/K

Forward Voltage

Vf


1.3

2

V

Kink deviation

KINK

30%

Beam divergence angle (parallel)

ϑ//


19


Deg

Beam Divergence angle (perpendicular)

ϑ


17


Deg

Resistance

Rs


8


ohm

Linewidth width

λ


3


MHZ


Symbol

Parameter

Test   Conditions

Min.

Typ.

Max.

Unit

Im

Threshold Current

CWT=25°C


20

40

mA

Po

Output Power

CWlth+20mA, T=25°C

4

6


mW

CW,   Ith + 200 mA, T=25 °C, TEC controlled.

50

80


SE

Slope Efficiency

CW,   Ith + 20   mA, T=25 °C

0.2

0.3


W/A

Vop

Operating Voltage

CW,   Ith + 20   mA


1.2

1.5

V

CW,   Ith + 200 mA, TEC controlled


2.5

3.5

υ

Linewidth

CW,   Ith + 200 mA, TEC controlled


3

10

MHz

RIN

Relative Intensity Noise

CW,   Ith +   200 mA, TEC controlled, @1GHz


-150

-145

dB/Hz

λc

Center Wavelength

CW, Ith + 20 mA

1306

1310

1316

nm

SMSR

Side Mode Suppression

Ration

CW, Ith + 20 mA

35

40


dB

ϑ//

Beam Divergence Angle (parallel)

CW, Ith + 20 mA


19


Deg.

ϑ

Beam Divergence Angle (perpendicular)

CW, Ith + 20 mA


17


Deg.


Handling Procedures

1. Suggested bonding condition

● Bonding temperature: 350℃

● Bonding force: 30 grams (not exceed 40 grams)

● Bonding force and temperature should be applied in a gradual fashion

● Bonding time: <= 10 seconds

2. Suggested burn-in conditions

Conditions 1: 

● Chip heatsink temperature: 100℃ 

● Current: 100mA 

● Time: 24 hours 

● Pass Criteria: BI 0hrs LIV1;BI 24hrs LIV2 Compare LIV2 to LIV1 

● Delta Ith (T=25℃) ≤1mA and Delta Pf(T=25℃) ≤10%

Conditions 2: 

● Chip heatsink temperature: 100℃ 

● Current: 100mA 

● Time: 24 hours+48hrs 

● Pass Criteria: BI 24hrs LIV1;BI 24hrs+48hrs LIV2 Compare LIV2 to LIV1 

● Delta Ith (T=25℃) ≤0.7mA and Delta Pf(T=25℃) ≤5%


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